fault models造句
例句與造句
- Fault models can be used in almost all branches of engineering.
- In electronics, methods based on fault models of structural analogs gain some acceptance in industry.
- "' Single stuck line "'is a fault model used in digital circuits.
- A differential fault attack has been published using 7 faulty cipher texts under random 4 bit nibble fault model
- Thus, this method is able to detect a wide range of faults, and is not limited to a specific fault model.
- It's difficult to find fault models in a sentence. 用fault models造句挺難的
- The conjugate fault model is a simple way to obtain approximate orientations of stress axes, due to the abundance of such structure in the upper brittle crust.
- A "'fault model "'is an engineering model of something that could go wrong in the construction or operation of a piece of equipment.
- In balancing these various factors it also provides an estimate of how much seismicity is not accounted for in the fault model, possibly in faults not yet discovered.
- The fault model database has been revised and expanded to cover over 350 fault sections, up from about 200 for UCERF2, and new attributes added to better characterize the faults.
- To use this fault model, each input pin on each gate in turn, is assumed to be grounded, and a " test vector " is developed to indicate the circuit is faulty.
- The researchers say that the earlier study applied the ground-movement data to a fault model similar to that found at the edges of tectonic plates, while the New Madrid zone is in the middle of one.
- This causes an unnecessary increase in network complexity, and possibly hampering the ability to test manufactured designs using traditional test methods ( single stuck-at fault models ) . ( Note : testing might be possible using IDDQ models .)
- He is credited with developing two approaches to detecting Transition Faults ( a type of Fault model ) that might occur during the manufacturing of semiconductor chips, viz ., the Skewed-Load Transition Test ( Launch-off-shift at-speed test ) and the Broad-side delay test ( Launch on Capture at-speed test ).